Material testing of optical test pieces
US11790510B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2019 |
| Grant date | Oct 17, 2023 |
| Priority date | — |
| Expiry date | Jun 4, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to techniques for material testing of optical test pieces, for example of lenses. Angle-variable illumination, using a suitable illumination module, and/or angle-variable detection are carried out in order to create a digital contrast. The digital contrast can be, for example, a digital phase contrast. A defect detection algorithm for automated material testing based on a result image with digital contrast can be used. For example, an artificial neural network can be used.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.