Patent · US Active

Material testing of optical test pieces

US11790510B2 · kind B2 · utility

0Cited by
2References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2019
Grant dateOct 17, 2023
Priority date
Expiry dateJun 4, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/20084
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The invention relates to techniques for material testing of optical test pieces, for example of lenses. Angle-variable illumination, using a suitable illumination module, and/or angle-variable detection are carried out in order to create a digital contrast. The digital contrast can be, for example, a digital phase contrast. A defect detection algorithm for automated material testing based on a result image with digital contrast can be used. For example, an artificial neural network can be used.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.