Method for measuring multiple parameters of mixed gases based on broadband infrared light source
US11796459B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2023 |
| Grant date | Oct 24, 2023 |
| Priority date | — |
| Expiry date | Jun 6, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0636
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring multiple parameters of mixed gases based on broadband infrared light source is provided, including: filtering a broadband infrared laser, and forming a laser beam including three narrow-linewidth wavelengths; dividing the laser beam into a first sub-laser beam and a second sub-laser beam; focusing and transmitting the first sub-laser beam to a gas sample cell; focusing and transmitting the first sub-laser beam to a first reflector; reflecting and transmitting the first sub-laser beam; reflecting and transmitting the second sub-laser beam to the second beam splitter; combing the first sub-laser beam transmitted by the second beam splitter and the second sub-laser beam reflected by the second beam splitter, measuring the multiple parameters; combining and transmitting the second sub-laser beam transmitted by the second beam splitter and the first sub-laser beam reflected by the second beam splitter to a spectrometer for measuring concentrations the mixed gases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.