Device for recognizing defects remaining in finished surface of product
US11796483B2 · kind B2 · utility
2Cited by
1References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 7, 2021 |
| Grant date | Oct 24, 2023 |
| Priority date | — |
| Expiry date | May 19, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device to detect defects in a finished surface by analyzing images thereof includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, and a light source assembly. The processor is used to connect to a camera assembly, and preprocess image obtained of the front of the product to obtain a detection of any defects of the front of the product.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.