Patent · US Active

Systems and methods for optimizing an instrument system workflow

US11802883B2 · kind B2 · utility

0Cited by

0References

22Claims

0Family size

Assignee

Berkeley Lights, Inc. · US

Inventors

Darshan Thaker · Oakland, US
Matthew E. Fowler · Emeryville, US
Samira A. Nedungadi · Oakland, US
Daniel A. Banda Villanueva · Oakland, US
Brandon R. Bruhn · Berkeley, US
Nenad Bozinovic · San Francisco, US
Kellen C. Mobilia · Dublin, US

Key dates

Filing date	May 22, 2020
Grant date	Oct 31, 2023
Priority date	—
Expiry date	May 8, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG01N2035/0091
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system and a method for dynamically optimizing an instrument system workflow based on operational monitoring and managing of a workflow for a hardware system. The system includes instrument resources and sample chambers, each resource and chamber with a dedicated sensor configured to acquire data. The system further includes a computing device communicatively connected to the instrument resources and sample chambers. The computing device includes a software application or program comprising a workflow builder, an execution engine, an analytics engine, a virtual system modeling engine, and an optional machine learning engine.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.