System and method for automatically generating test cases for testing SDKS
US11803462B1 · kind B1 · utility
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Key dates
| Filing date | Apr 27, 2022 |
| Grant date | Oct 31, 2023 |
| Priority date | — |
| Expiry date | Jul 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3676
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An automatic SDK testing case generation system includes a computer software application for automatically generating optimized test cases. The automatic SDK testing case generation system categorizes candidate APIs presented by an SDK to be tested. The categories conform to an API call category sequence. The system iterates through API calling paths, which conform to the API call category sequence, to generate optimized subsets of test cases. The combination of the optimized subsets of test cases forms the final set of test cases for being used to test the SDK.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.