Manufacturing quality improvement through statistical root cause analysis using convolution neural networks
US11803953B2 · kind B2 · utility
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Key dates
| Filing date | Mar 28, 2018 |
| Grant date | Oct 31, 2023 |
| Priority date | — |
| Expiry date | Feb 25, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30108
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A quality improvement method for an image sensor array includes collecting in-line optical inspection data of the image sensor, collecting end of line electrical data of the image sensor, creating defect maps and obtaining x-y coordinates of the optical inspection data and the electrical data, correlating the defect maps to generate correlated defects, classifying the images of the correlated defects, and generating root cause statistics of the classified correlated defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.