Method and system for generating image sample having specific feature
US11804037B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 9, 2023 |
| Grant date | Oct 31, 2023 |
| Priority date | — |
| Expiry date | Jun 9, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20132
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present application provides a method and a system for generating an image sample having a specific feature. The method includes: training a generative adversarial network-based sample generation model, where the generative adversarial network includes a generator and two discriminators: a global discriminator configured to perform global discrimination on an image, and a local discriminator configured to perform local discrimination on a specific feature; and inputting, to a trained generator that serves as a sample generation model, a semantic segmentation image that indicates a location of the specific feature and a corresponding real image not having the specific feature, to obtain a generated image sample having the specific feature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.