Patent · US Active

Keypoint-based sampling for pose estimation

US11804040B2 · kind B2 · utility

1Cited by

1References

28Claims

0Family size

Assignee

QUALCOMM Incorporated · US

Inventors

Shreyas HAMPALI · Graz, AT
Vincent Lepetit · Talence, FR
Clemens Arth · Graz, AT

Key dates

Filing date	Dec 2, 2021
Grant date	Oct 31, 2023
Priority date	—
Expiry date	Dec 16, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30244
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Systems and techniques are provided for determining one or more poses of one or more objects. For example, a process can include determining, using a machine learning system, a plurality of keypoints from an image. The plurality of keypoints are associated with at least one object in the image. The process can include determining a plurality of features from the machine learning system based on the plurality of keypoints. The process can include classifying the plurality of features into a plurality of joint types. The process can include determining pose parameters for the at least one object based on the plurality of joint types.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.