Automated attribution modeling and measurement
US11810147B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2017 |
| Grant date | Nov 7, 2023 |
| Priority date | — |
| Expiry date | Jun 30, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q30/0242
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
The present disclosure relates to systems and methods for automatic attribution modeling and measurement. In aspects, a system may receive identification information associated with profiles and electronic devices that were exposed to a certain piece of targeted content. The demographic and device data associated with the individuals who were exposed to the targeted content are used to create a control group of individuals who were not exposed to that targeted content. The real-world visit rates of the exposed group and the control group to one or more locations may be monitored over a period of time (or campaign) and evaluated to assess the effectiveness of the targeted content.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.