Patent · US Active

Active stabilization of parasitic fringes in optical spectrometers

US11815450B2 · kind B2 · utility

0Cited by

4References

27Claims

0Family size

Assignee

THE TRUSTEES OF PRINCETON UNIVERSITY · US

Inventors

Chu C. Teng · Princeton, US
Gerard Wysocki · Princeton, US

Key dates

Filing date	Mar 8, 2022
Grant date	Nov 14, 2023
Priority date	—
Expiry date	Mar 8, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/12
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed are a system and method for active stabilization of parasitic fringes in optical spectrometers, wherein the spectrometer obtains the transmission spectrum, and a signal processor extracts the etalon drift from the spectral signatures of parasitic fringes. The disclosed approach improves spectrometer accuracy, minimizes drift, and increases time between calibrations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.