Autofocus functionality in optical sample analysis
US11815458B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2020 |
| Grant date | Nov 14, 2023 |
| Priority date | — |
| Expiry date | May 9, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/6482
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method comprises: directing, using an objective and a first reflective surface, first autofocus light toward a sensor, the first autofocus light reflected from a first surface of a substrate; preventing second autofocus light from reaching the sensor, the second autofocus light reflected from a second surface of the substrate; and directing, using the objective and a second reflective surface, emission light toward the sensor, the emission light originating from a sample at the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.