Device for measuring complex dielectric permittivity of a material-under-test, measuring device for multiple reflections of time-domain signals of a complex dielectric and measuring method thereof
US11815484B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 19, 2022 |
| Grant date | Nov 14, 2023 |
| Priority date | — |
| Expiry date | May 19, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring the complex dielectric permittivity of a material under test (MUT) includes an electromagnetic wave generating/receiving unit, a transmission line, a self-referencing waveguide section and a sensing waveguide section. The electromagnetic wave generating/receiving unit is configured to generate an electromagnetic wave signal. The transmission line has a first characteristic impedance and transmits the electromagnetic wave signal. The self-referencing waveguide section has a second characteristic impedance, and includes a front end and a back end, wherein a first reflection signal is sent from the front end. The sensing waveguide section is connected to the back end, and configured to cooperate with the back end to send out remaining subsequent reflection signals, wherein the electromagnetic wave generating/receiving unit receives the first reflection signal and the remaining subsequent reflection signals to measure the complex dielectric permittivity of the MUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.