Quality assessment of extracted features from high-dimensional machine learning datasets
US11816127B2 · kind B2 · utility
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18Claims
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Key dates
| Filing date | Feb 26, 2021 |
| Grant date | Nov 14, 2023 |
| Priority date | — |
| Expiry date | Aug 1, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N20/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A quality determination method, system, and computer program product that includes performing a dimensionality reduction on a high-dimensional dataset to form a dimensional-reduced dataset and determining, using a machine learning tool executed on a computing device, a quality of the dimensional-reduced dataset via a review of an extracted feature extracted from the dimensional-reduced dataset.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.