Patent · US Active

Calibration method and apparatus, terminal device, and storage medium

US11816547B2 · kind B2 · utility

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7Claims
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Key dates

Filing dateJul 23, 2021
Grant dateNov 14, 2023
Priority date
Expiry dateJul 23, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N20/00
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A calibration method, a calibration apparatus, a terminal device and a storage medium are provided. The method comprises the following steps: determining layer attribute information of each to-be-calibrated layer in a model (S110); and determining the group in which each of the to-be-calibrated layers is located according to the total available resources and the layer attribute information of each of the to-be-calibrated layers (S120). The layer attribute information of any of the to-be-calibrated layers comprises layer required resources, the layer required resources are resources needing to be occupied when the to-be-calibrated layer is calibrated; and the total available resources are the total resources used for calibration. By means of the method, all of to-be-calibrated layers can be reasonably grouped on the premise that the total available resources can provide support, so that the layer required resources in each calibration operation are balanced and large as much as possible, thereby making full use of resources. Moreover, the number of calibration operations is reduced, and the calculation speed during the calibration of a model is increased.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.