Measurement parameter optimization method and device, and computer control program stored on computer-readable storage medium
US11816754B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2021 |
| Grant date | Nov 14, 2023 |
| Priority date | — |
| Expiry date | Jul 1, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30242
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A measurement parameter for use when measuring an object with a measuring device provided on a robot may be adjusted and optimized significantly more easily than in conventional technology. A measurement parameter optimization method or operations performed by a processor may include: acquiring N captured images of objects with first measurement parameters; estimating recognized object counts Zi for the objects based on acquiring N/j captured images of the objects with second measurement parameters, and storing the recognized object counts Zi as first data; based on acquiring N/j/k captured images of the objects with third measurement parameters, estimating recognized object counts Zi for the objects based on the first data and storing the recognized object counts Zi as second data; and determining an optimized measurement parameter that satisfies a predetermined judgment criterion from among the second data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.