Correcting error vector magnitude measurements
US11817913B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2022 |
| Grant date | Nov 14, 2023 |
| Priority date | — |
| Expiry date | May 17, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An example process determines a first error vector magnitude (EVM) of a signal output by a device under test (DUT). The process includes adding attenuation on a signal path between the DUT and a vector signal analyzer (VSA), where the attenuation is changeable: measuring, at the VSA, at least two second EVMs for different values of attenuation of the signal output by the DUT, where the at least two second EVMs are corrupted by noise from the VSA, and where each of the at least two second EVMs is based on two or more measurements; and determining the first EVM based on a linear relationship that is based on the first EVM, the at least two second EVMs, and a function based on the attenuation, where the first EVM is without at least some of the noise from the VSA.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.