Sensor calibration
US11821754B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2022 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Feb 18, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P21/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and techniques are described herein. For example, a process can include obtaining first sensor measurement data associated with a and second sensor measurement from one or more sensors. In some cases, the first measurement data can be associated with a first time and the second sensor measurement data can be associated with a second time occurring after the first time. In some aspects, the process includes determining that the first sensor measurement data and the second sensor measurement data satisfy at least one batching condition. In some examples, the process includes, based on determining that the first sensor measurement data and the second sensor measurement data satisfy the at least one batching condition, generating a sensor measurement data batch including the first sensor measurement data, the second sensor measurement data, and at least one target sensor measurement data. Ins examples the process includes outputting the sensor measurement data batch.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.