Moiré-based distance measurement method
US11821755B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 19, 2023 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Jul 19, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C3/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for providing an object distance of a device under test (DUT) using a system including a first lens, a second lens, an optical pinhole disposed between the first lens and the second lens, a detector, a pair of gratings disposed between the second lens and the detector, the detector configured for receiving a Moiré pattern formed as a result of light from of the DUT being disposed through the first lens, the optical pinhole, the second lens and the pair of gratings, the method including obtaining the Moiré pattern using the detector and determining the object distance based on the Moiré pattern and one or more properties of the pair of gratings.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.