Validation of a measurement machine
US11821758B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 25, 2021 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | May 3, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M15/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present disclosure relates to methods and systems for validating a measurement machine. A group of validation measurements associated with a reference part is obtained. The group of validation measurements includes at least a first measurement associated with a first tolerance and a second measurement associated with a second tolerance, the second tolerance being smaller than the first tolerance. A dimension of the reference part associated with the first measurement is measured to obtain a measurement value. The measurement value is compared to a nominal value associated with the first measurement to obtain a measurement error. The measurement error is compared to the second tolerance associated with the second measurement. When the measurement error is less than the second tolerance, a validation signal is issued to the measurement machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.