Radiometric modeling for optical identification of sample materials
US11822033B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2019 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Jul 18, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for implementing and utilizing radiometric characterization in combination with reference material characterization of an optical sensor to more accurately and efficiently measure material properties are disclosed. In some embodiments, a method for for optically measuring material properties includes an optical sensor being radiometrically characterized based on measured optical responses. A model is generated and includes model components of the optical sensor. A parameterized model is generated by fitting n variable parameters of the model components using the optical responses. The optical sensor is utilized to measure an optical response to a reference material and a re-parameterized model is generated by re-fitting m of the n variable parameters of the model components based, at least in part, on the measured optical response to the reference material, wherein m is less than n.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.