Patent · US Active

Security scanning inspection system and method

US11822040B2 · kind B2 · utility

0Cited by
0References
10Claims
0Family size

Inventors

Key dates

Filing dateJan 6, 2020
Grant dateNov 21, 2023
Priority date
Expiry dateAug 31, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V2201/08
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present disclosure relates to a security scanning inspection system and method. The security scanning inspection system comprises a detector, a scanning device and a controller, wherein the detector is configured to detect a protective attribute of an object to be inspected; the scanning device is movably arranged and the scanning device is configured to emit a scanning ray during movement to perform a security scanning inspection on the object to be inspected, the scanning device comprising at least two working modes, wherein a dose of a scanning ray in each working mode is different from a dose of a scanning ray in any other working modes; and the controller configured to select a working mode of the scanning device according to the protective attribute of the object to be inspected detected by the detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.