Automated testing methods for condition analysis and exploration
US11822446B2 · kind B2 · utility
0Cited by
7References
18Claims
0Family size
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Key dates
| Filing date | Mar 1, 2022 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Apr 8, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/865
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An embodiment of the present invention is directed to a novel approach of applying Machine Learning, statistical methods and/or other algorithms to identify associations of input conditions and values with results of requirements, measures of performance assessments, and/or other indications. These associations may be provided to an analyst, system designer, other recipient and/or receiving system or component to inform of input conditions and values that uncover system sensitivities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.