Patent · US Active

Assembly line with integrated electronic visual inspection

US11823371B2 · kind B2 · utility

0Cited by
15References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 26, 2021
Grant dateNov 21, 2023
Priority date
Expiry dateSep 1, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30242
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Methods and systems are disclosed for obtaining a first image of a tray, determining a presence or absence of one or more first patterns in the first image, determining a rotation of each the one or more first patterns in the first image, and performing an action based on the presence or absence and the rotation of the one or more first patterns in the first image.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.