Three-dimensional measurement method and related apparatus
US11823405B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 13, 2023 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Jan 13, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10028
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional measurement method comprises: converting a total number of levels of sawtooth fringes into a Gray code and acquiring a sawtooth slope coefficient; fusing the coefficient into a sawtooth fringe image to generate a target sawtooth fringe pattern; projecting each target sawtooth fringe pattern to a surface of a to-be-measured object through a projector, and collecting a deformed target sawtooth fringe pattern on the surface through a camera; solving a Gray code of each sawtooth fringe collection pattern at each pixel point according to a differential property of adjacent pixels in each sawtooth fringe collection pattern and solving a fringe level and a wrapped phase at each pixel point; calculating an absolute phase at each pixel point according to the fringe level and the wrapped phase at each pixel point, and reconstructing a three-dimensional point cloud through triangulation ranging to obtain a three-dimensional model of the to-be-measured object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.