Indirect bandgap, perovskite-based X-ray detector and method
US11824132B2 · kind B2 · utility
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Key dates
| Filing date | Apr 23, 2020 |
| Grant date | Nov 21, 2023 |
| Priority date | — |
| Expiry date | Jul 23, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K39/36
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
An X-ray system includes an X-ray generation unit configured to generate X-rays; an X-ray detection unit including at least one X-ray sensor that includes an indirect bandgap, perovskite semiconductor material, the X-ray sensor being configured to record the X-rays; and a control unit that controls a generation of the X-rays and a detection of the X-rays at the X-ray detection unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.