Patent · US Active

Optical position-measuring device

US11828630B2 · kind B2 · utility

0Cited by

2References

9Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Wolfgang Holzapfel · Obing, DE
Daniel Frese · Traunstein, DE
Christoph Lingk · Traunstein, DE

Key dates

Filing date	Jul 10, 2020
Grant date	Nov 28, 2023
Priority date	—
Expiry date	Aug 31, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01D2205/90
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an optical position-measuring device for acquiring the rotational angle between two objects that are rotationally moveable relative to each other, a grating measuring standard rotating about an axis of rotation is arranged as a reflection grating. Position information both about an azimuthal rotary movement about the axis of rotation and about a radial displacement of the grating measuring standard is able to be obtained. At least one detection unit is used for scanning the rotating grating measuring standard in order to determine the azimuthal rotational angle as well as a radial displacement of the grating measuring standard. The neutral pivot points of the scanning of the grating measuring standard for the determination of the rotational angle and the displacement are situated in the same plane, with this plane being situated in parallel with the grating measuring standard. The neutral pivot point denotes the particular location about which the grating measuring standard or the detection unit is able to be tilted without a position offset.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.