Spatial image processing for enhanced gas imaging systems and methods
US11828704B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 11, 2020 |
| Grant date | Nov 28, 2023 |
| Priority date | — |
| Expiry date | Sep 29, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/23
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various techniques are provided for increasing contrast of gas features in a scene. In one example, a method includes receiving a captured infrared image comprising a gas feature and a scene feature. The captured infrared image comprises a first range of pixel values associated with a first temperature range of the gas feature and the scene feature. The method also includes applying a spatial filter to the captured infrared image to provide a spatially filtered infrared image retaining the gas feature and removing the scene feature. The spatially filtered infrared image comprises a second range of pixel values associated with a second temperature range of the gas feature without the additional scene feature to exhibit increased gas contrast over the captured infrared image. Additional methods and systems are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.