Patent · US Active

Method for structuring an insulating layer on a semiconductor wafer

US11830962B2 · kind B2 · utility

0Cited by
5References
4Claims
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Assignee

Inventors

Key dates

Filing dateFeb 9, 2022
Grant dateNov 28, 2023
Priority date
Expiry dateFeb 9, 2042

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/544

Abstract

A method for structuring an insulating layer on a semiconductor wafer, at least comprising the steps of: Provision of a semiconductor wafer with a top, a bottom and comprising multiple solar cell stacks, wherein each solar cell stack is a Ge substrate, which forms the bottom of the semiconductor wafer, a Ge subcell and at least two III-V subcells, in the above order, and at least one passage opening, which extends from the top to the bottom of the semiconductor wafer and has a connected side wall, an insulating layer two-dimensionally deposited on the top of the semiconductor wafer, on the side wall of the passage opening and/or on the bottom of the semiconductor wafer, and the deposition of an etch-resistant filling material by means of a printing process on an area of the top which comprises the passage opening, and into the passage opening.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.