Short circuit test device
US11831152B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 7, 2021 |
| Grant date | Nov 28, 2023 |
| Priority date | — |
| Expiry date | Feb 22, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/52
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A short circuit test device includes: a first line test conductor couplable to a first load line conductor of an electric load network and a neutral test conductor couplable to a neutral conductor of the electric load network; a voltage source switchable to the first line test conductor and the neutral test conductor to output a predefinable test signal; a measurement unit for measuring an electric voltage and/or current, the measurement unit including measurement inputs which are connectable to the first line test conductor and the neutral test conductor, the measurement unit including an output for providing a measurement signal; and a control unit connected to the voltage source and the measurement unit, the control unit: causing the voltage source to apply a test voltage to the first line test conductor and the neutral test conductor and comparing the measurement signal provided by the measurement unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.