Patent · US Active

Short circuit test device

US11831152B2 · kind B2 · utility

0Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 2021
Grant dateNov 28, 2023
Priority date
Expiry dateFeb 22, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/52
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A short circuit test device includes: a first line test conductor couplable to a first load line conductor of an electric load network and a neutral test conductor couplable to a neutral conductor of the electric load network; a voltage source switchable to the first line test conductor and the neutral test conductor to output a predefinable test signal; a measurement unit for measuring an electric voltage and/or current, the measurement unit including measurement inputs which are connectable to the first line test conductor and the neutral test conductor, the measurement unit including an output for providing a measurement signal; and a control unit connected to the voltage source and the measurement unit, the control unit: causing the voltage source to apply a test voltage to the first line test conductor and the neutral test conductor and comparing the measurement signal provided by the measurement unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.