Optoelectronic measuring device for measuring an intensity of electromagnetic radiation

US11835384B2 · kind B2 · utility

Assignee

• OSRAM Opto Semiconductors GmbH · DE

Inventors

• Daniel Dietze · Regensburg, DE
• Wolfgang Zinkl · Tegernheim, DE

Key dates

• Filing date: May 12, 2020
• Grant date: Dec 5, 2023
• Expiry date: May 12, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2003/1226
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In an embodiment, an optoelectronic measuring device includes a first detector configured to provide a first detector signal, a second detector configured to provide a second detector signal, wherein each of the first detector and the second detector is configured to detect electromagnetic radiation, a signal difference determiner configured to generate a difference signal by subtracting the second detector signal from the first detector signal and a spectral filter arranged in a beam path upstream of the second detector, wherein the spectral filter is configured to filter the electromagnetic radiation before detection by the second detector, wherein the optoelectronic measuring device is configured to measure an intensity of the electromagnetic radiation impinging on the optoelectronic measuring device.