Fountain solution thickness measurement system and method using ellipsometry
US11835446B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2021 |
| Grant date | Dec 5, 2023 |
| Priority date | — |
| Expiry date | Jun 30, 2042 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41P2233/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical light reflectance measurement system above an imaging member surface measures fountain solution surface light reflectance interference on reflective substrate portions of the imaging member surface in real-time during a printing operation. The measured light reflectance interference corresponds to a thickness of the fountain solution layer and may be used in a feedback loop to actively control fountain solution layer thickness by adjusting the volumetric feed rate of fountain solution added onto the imaging member surface during a printing operation to reach a desired uniform thickness for the printing. This fountain solution monitoring system may be fully automated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.