Fault injection event detection at a chip and related systems, method and devices
US11836278B2 · kind B2 · utility
0Cited by
3References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 26, 2021 |
| Grant date | Dec 5, 2023 |
| Priority date | — |
| Expiry date | May 26, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K3/356104
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Disclosed is a fault event detector configured to detect a fault injection event in an area of a chip that includes a vulnerable digital circuit. Such a fault event detector may include a bistable device that changes state at least partially in response to a presence of a fault injection event in a surrounding area of the fault event detector. Such a fault event detector may be arranged relative to a vulnerable digital circuit such that the vulnerable digital circuit is substantially located within the surrounding area of the first fault event detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.