Patent · US Active

Inventory management system with statistical learning

US11836671B2 · kind B2 · utility

0Cited by
5References
7Claims
0Family size

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Key dates

Filing dateDec 3, 2020
Grant dateDec 5, 2023
Priority date
Expiry dateSep 24, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06K7/10475
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Response parameters for a population of RFID tags present in an inventory space are determined by (a) continuously scanning the inventory space to interrogate the population of RFID tags in the inventory space and receiving responses from multiple RFID tags within the population, (b) after multiple responses have been received from a specific RFID tag within the population, determining response times for the specific RFID tag corresponding to time periods between sequential ones of the multiple responses from the specific RFID tag, (c) calculating a maximum acceptable response time based at least in part on the response times determined in step (b), and (d) recording a response interval data set including one or more of the response times determined in step (b) and the maximum acceptable response time calculated in step (c).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.