Intersection testing for ray tracing
US11836846B2 · kind B2 · utility
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16Claims
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Key dates
| Filing date | Sep 30, 2021 |
| Grant date | Dec 5, 2023 |
| Priority date | — |
| Expiry date | Nov 17, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for performing intersection testing of rays in a ray tracing system. The ray tracing system uses a hierarchical acceleration structure comprising a plurality of nodes, each identifying one or more elements able to be intersected by a ray. The system makes use of a serial-mode ray intersection process, in which, when a ray intersects a bounding volume, a limited number of new ray requests are generated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.