Patent · US Active

Method and system for direct determination of theoretical damage to at least one component of a device

US11841001B2 · kind B2 · utility

0Cited by
1References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 2019
Grant dateDec 12, 2023
Priority date
Expiry dateJul 25, 2040

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/72
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for directly determining a theoretical damage of at least one component of a device includes providing load-specific reference data in an evaluation unit, sensing actual load-specific data by a load sensing system, and transmitting the actual, load-specific data to the evaluation unit. The actual load-specific data includes classified load collectives comprising a dwell time of occurring damage variables at defined load levels, a number of load changes of occurring damage variables, and an event count of occurring damage variables. The method further includes scaling the load-specific reference data to the actual load-specific data for calculating the theoretical damage of the at least one component and determining a remaining service life.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.