Method and system for direct determination of theoretical damage to at least one component of a device
US11841001B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 15, 2019 |
| Grant date | Dec 12, 2023 |
| Priority date | — |
| Expiry date | Jul 25, 2040 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02E10/72
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for directly determining a theoretical damage of at least one component of a device includes providing load-specific reference data in an evaluation unit, sensing actual load-specific data by a load sensing system, and transmitting the actual, load-specific data to the evaluation unit. The actual load-specific data includes classified load collectives comprising a dwell time of occurring damage variables at defined load levels, a number of load changes of occurring damage variables, and an event count of occurring damage variables. The method further includes scaling the load-specific reference data to the actual load-specific data for calculating the theoretical damage of the at least one component and determining a remaining service life.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.