Patent · US Active

Parameterization of a field device

US11841259B2 · kind B2 · utility

0Cited by

1References

12Claims

0Family size

Assignee

Endress+Hauser SE+Co. KG · DE

Inventors

Michèle Arnold · Hedingen, CH
Gerd Bechtel · Steinen, DE
Franco Ferraro · Bad Kötzting, DE

Key dates

Filing date	May 23, 2019
Grant date	Dec 12, 2023
Priority date	—
Expiry date	Jul 23, 2039

Classification

Technology area (CPC G)Physics
CPC primaryG01F25/20
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed is a method for parametering an apparatus for determining and/or monitoring a predeterminable fill level, wherein the apparatus includes a sensor unit and an electronics. The method includes determining an influence interval for a received signal received by the sensor unit as a function of an environmental parameter, determining a first value for the received signal or for a variable derived from the received signal corresponding to a first switch state, determining a second value for the received signal or for a variable derived from the received signal corresponding to a second switch state, and determining a third value for the received signal or for a variable derived from the received signal corresponding to a first switching point based on the first switch state and/or the second switch state and taking into consideration the at least one influence interval.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.