Patent · US Active

Determination and correction of retention time and mass/charge shifts in LC-MS experiments

US11841352B2 · kind B2 · utility

1Cited by
1References
9Claims
0Family size

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Key dates

Filing dateJul 31, 2019
Grant dateDec 12, 2023
Priority date
Expiry dateOct 4, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2030/862
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods are described for the automatic determination and correction of retention time shift of a MS data set relative to a control data set, to correct for retention time drifts endemic to targeted LCMS analyses. In an embodiment, a 2D grid of periodic MS spectra versus time is collected for a control experiment, and RT windows are determined with an additional set of unscheduled mass spectral analyses. During successive experiments, spectra from periodic MS scans are used to determine the correspondence between the current time and the time in the control experiment. The active set of MSn scans to be acquired by the instrument is then determined as the scans with adjusted retention time windows that bracket the corrected retention time.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.