Method and device for determining at least one parameter of an object
US11841418B2 · kind B2 · utility
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10Claims
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Key dates
| Filing date | Dec 20, 2018 |
| Grant date | Dec 12, 2023 |
| Priority date | — |
| Expiry date | Mar 30, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/43
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for determining at least one parameter of an object, wherein the method comprises the following steps:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.