Object defect correction
US11842472B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2020 |
| Grant date | Dec 12, 2023 |
| Priority date | — |
| Expiry date | Jan 15, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/06
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to embodiments of the present invention, a method, a device and a computer program product for image processing is provided. A computing device obtains an image of a first object, the image presenting a defect of the first object. A computing device obtains defect distribution information indicating respective frequencies of a plurality of predetermined categories of defects presented at corresponding locations in a plurality of training images, the plurality of training images presenting second objects and being used for training a defect classifier. A computing device determines a target category of the defect of the first object by applying the image and the defect distribution information to the defect classifier. A computing device generates one or more correction notifications.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.