Phased parameterized combinatoric testing for a data storage system
US11842782B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 30, 2021 |
| Grant date | Dec 12, 2023 |
| Priority date | — |
| Expiry date | Apr 23, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Phased parameterized combinatoric testing for a data storage system is disclosed. A testing recipe can be performed according to different input arguments. Combinatoric testing of the data storage system can be based on different combinations of operations and arguments. The disclosed testing can employ a consistent integer index for arguments passed into the sequenced operations of the recipe. The recipe can be employed to generate a phased test tree that can enable testing based on a phase rather than loading an entire test suite into memory. The consistent integer index can be used to identify failed test cases such that the entire test can be reconstituted from stored failed test information. Distribution of test cases to worker process can based on the phased test tree to facilitate interning an operation. Stored failed test information can include human-readable failure information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.