Patent · US Active

Fixture identification in test systems

US11846610B2 · kind B2 · utility

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0References
16Claims
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Assignee

Inventor

Key dates

Filing dateJan 15, 2021
Grant dateDec 19, 2023
Priority date
Expiry dateOct 17, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30164
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Described are systems and methods for fixture identification in test systems. A method for fixture identification in a test system may include capturing image data representative of a first fixture of the test system with an imaging device. The method may further include transmitting the image data representative of the first fixture from the imaging device to a processor running an image recognition application. The method may also include identifying the first fixture based on the image data with the processor running the image recognition application.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.