Fixture identification in test systems
US11846610B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 15, 2021 |
| Grant date | Dec 19, 2023 |
| Priority date | — |
| Expiry date | Oct 17, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described are systems and methods for fixture identification in test systems. A method for fixture identification in a test system may include capturing image data representative of a first fixture of the test system with an imaging device. The method may further include transmitting the image data representative of the first fixture from the imaging device to a processor running an image recognition application. The method may also include identifying the first fixture based on the image data with the processor running the image recognition application.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.