Method for assessing the thermal loading of a converter
US11846668B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 11, 2020 |
| Grant date | Dec 19, 2023 |
| Priority date | — |
| Expiry date | Aug 20, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L25/115
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for assessing the state of damage of a semiconductor module that is subject to operational loading, in particular a semiconductor module of a drive system converter, that includes at least one semiconductor component arranged on or in a support structure. It is possible not only to estimate a spent service life for the entire semiconductor module, but also to detect unexpected or undesirable loading states and thus a premature reduction of the remaining service life of the semiconductor module. Continuous load assessments are thus possible already during the operation of the semiconductor module and allow interventions to be made in good time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.