Patent · US Active

Location measuring system

US11846718B2 · kind B2 · utility

0Cited by
2References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 15, 2021
Grant dateDec 19, 2023
Priority date
Expiry dateOct 15, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S5/16
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This application relates to a location measuring system including a driving-type working device. In one aspect, the system includes a data receiving unit that receives marking data about a working surface, a marking unit that executes a marking operation with respect to the working surface corresponding to the marking data, and a scanning unit that scans a target space. The system may also include a scan condition setting unit that sets a movement path of the driving-type working device corresponding to the marking data, sets a scanning position for scanning the target space in consideration of space map data corresponding to the target space, and sets a scan angle of the scanning unit at the scanning position. The system may further include a position detecting unit that compares scan data acquired via the scanning unit with the space map data to detect a position of the driving-type working device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.