Patent · US Active

Apparatus, system and method for developing industrial process solutions using artificial intelligence

US11846933B2 · kind B2 · utility

0Cited by
2References
20Claims
0Family size

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Key dates

Filing dateJan 11, 2019
Grant dateDec 19, 2023
Priority date
Expiry dateApr 18, 2042

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q10/20
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

An apparatus, system and method of providing industrial analytics. The apparatus, system and method include at least a plurality of sensors sensing performance indicators for an industrial process across multiple nodes, wherein ones of the multiple nodes are remote from each other; at least one machine learning module comprising non-transitory computing code executed by a processor. When executed by the processor, the code causes the steps of: receiving user input regarding at least the industrial process and a data set; selecting a model based on at least the user input, wherein the selected model comprises a plurality of learnings based on the performance indicators sensed by multiple sensors across at least multiple ones of the multiple nodes; applying the selected model to the data set; assessing at least the performance indicators for the data set upon application of the selected model; and outputting the assessed performance indicator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.