Image based counterfeit detection
US11847661B2 · kind B2 · utility
0Cited by
10References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2018 |
| Grant date | Dec 19, 2023 |
| Priority date | — |
| Expiry date | Oct 21, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/467
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for authenticating material samples are provided. Digital images of the samples are processed to extract computer-vision features, which are used to train a classification algorithm along with location and optional time information. The extracted features/information of a test sample are evaluated by the trained classification algorithm to identify the test sample. The results of the evaluation are used to track and locate counterfeits or authentic products.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.