Window defect sensing and image processing
US11851030B2 · kind B2 · utility
0Cited by
8References
20Claims
0Family size
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Key dates
| Filing date | May 26, 2022 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | May 26, 2042 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/90
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Various embodiments relate to sensing defects associated with a window. Furthermore, various embodiments relate to performing image processing to produce a corrected image of a scene based at least partly on data corresponding to the detected defects. In some examples, one or more lighting modules may be used to illuminate the window to facilitate detection of the defects by one or more sensor devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.