Circuit screening system and circuit screening method
US11852682B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 14, 2022 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Nov 14, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31721
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit screening system including a target circuit under test receiving a first testing signal in a first period and a second testing signal in a second period; a power circuit providing a supply voltage to the target circuit under test, the supply voltage maintaining at a first voltage level in the first period and deviating from the first voltage level, and maintaining at the first voltage level in the second period; and a clock generating circuit providing a clock signal to the target circuit under test, the clock signal triggering the target circuit under test to receive the first testing signal in the first period and the second testing signal in the second period; the clock signal having a first profile and a second profile in the first period and the second period, respectively, and the first profile and the second profile having a phase difference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.