Defect centre-based sensor
US11852701B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2020 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Dec 4, 2040 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2006/12138
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A defect centre-based sensor is disclosed. The sensor comprises instrumentation which includes a generator for causing excitation in an active element, for example a diamond, and a detector for measuring a transition in the active element. The generator is an optical source and/or the detector is an optical detector. The sensor further comprises an optical waveguide and a sensor head in communication with the source and/or the detector via the optical waveguide. The sensor head houses the active element having at least one defect centre, for example, a nitrogen vacancy, responsive to an applied magnetic field, electric field or temperature and a signal delivery arrangement, for example at least one lens, arranged to optically couple the optical waveguide to the active element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.