Device and method for measuring depth of object
US11852823B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 24, 2021 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Feb 2, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20021
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, by an augmented reality device, of measuring a depth of an object includes determining, from a dot-pattern and a surface-pattern, a pattern of light to be emitted for measuring the depth of the object, identifying, from within an entire area of a pattern generator, a partial area of a light source unit corresponding to an area for the determined pattern, emitting light through the area for the determined pattern, by activating the identified partial area of the light source unit, receiving light reflected from the object; and measuring the depth of the object based on the emitted light and the received reflected light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.