System and method for calibrating a three-dimensional scanning device
US11854302B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 28, 2021 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | May 25, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/10028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for calibrating a three-dimensional scanning device includes a structured-light scanner capable of performing a structured-light operation, and a processor that performs calibration on a device under calibration (DUC). The structured-light scanner captures a base image by performing the structured-light operation prior to calibration. The structured-light scanner captures a calibration image with respect to corresponding DUC during calibration, and the calibration image is inputted to the processor, which determines transformation mapping from the calibration image to the base image. The determined transformation is then transferred to the DUC during calibration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.